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2.2 ELECTRICAL, ELECTRONIC, INFORMATION ENGINEERING
The temperature dependence of the thickness of thick free-standing ﬁlms is studied using a high-resolution ﬁlm thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
Blanc, C. et al. (2007). Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals. Physical Review E vol. 75, pp. 1-4