Document Type

Article

Rights

This item is available under a Creative Commons License for non-commercial use only

Disciplines

2.2 ELECTRICAL, ELECTRONIC, INFORMATION ENGINEERING

Publication Details

Physical Review E

Abstract

The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.

DOI

10.1103/PhysRevE.75.042701

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